OPTO-EDU A63.7220 Field Emission Transmission Electron Microscope, 200KV, 1500000x
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Accelerating Voltage200 kV, Factory Aligned at 80 kV and 200kV
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Electron SourceHigh Brightness Schottky Field Emitter
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Probe Current≥ 1.5nA/1nm Probe
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TEM Line Resolution0.23 nm
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FEG Gun Vacuum< 1x10-6Pa,
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GoniometerFully Eccentric Goniometer With All 5-Axis Motorized
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Place of OriginChina
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Nama merekCNOEC, OPTO-EDU
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SertifikasiCE, Rohs
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Model NumberA63.7220
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Dokumen
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Minimum Order Quantity1 pc
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HargaFOB $1~1000, Depend on Order Quantity
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Packaging DetailsCarton Packing, For Export Transportation
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Delivery Time5~20 Days
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Payment TermsT/T, West Union, Paypal
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Supply Ability5000 pcs/ Month
OPTO-EDU A63.7220 Field Emission Transmission Electron Microscope, 200KV, 1500000x
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A63.7220 is a Field Emission Transmission Electron Microscope (TEM), 200KV, 1500000x, independently developed & designed for materials science, semiconductors and other fields. This electron microscope is designed to be easy to operate and highly stable, and can provide solutions such as in-situ, high-resolution and microcrystal electron diffraction. |
| Friendly Design | Refined appearance and UI design, brand-new vision, meet the operation needs of users of different levels; provide operation video tutorials. |
| New Lens Barrel Design | It adopts a four-stage condenser system design, which can be independently controlled, which is conducive to controlling the electron beam convergence angle and intensity for various imaging studies; it is also equipped with a large pole shoe, which can perform in-situ characterization under a variety of conditions. |
| High Quality Imaging | The electron microscope is equipped with a highly sensitive CMOS camera, which can easily obtain high-quality images. |
| Field Emission Transmission Electron Microscope (TEM), 200KV, 1500000x | |
| Accelerating Voltage | 200 kV, Factory Aligned at 80 kV and 200kV |
| Electron Source | High Brightness Schottky Field Emitter |
| Probe Current | ≥ 1.5nA/1nm Probe |
| Beam Current | Maximum ≥ 50nA At 200kV |
| TEM Line Resolution | 0.23 nm |
| TEM Information Limit | 0.2 nm |
| Magnification | 20x to 1500000x. |
| FEG Gun Vacuum | < 1x10-6Pa, |
| TEM Column Vacuum | <5x10-5Pa |
| Goniometer | Fully Eccentric Goniometer With All 5-Axis Motorized |
| Camera | 20M Speed Enhanced Bottom Mounted CMOS Camera EMSIS XAROSA 5120x3840 |
| Stage | Compu Stage Double-tilt Holder |
| X ±1mm, Y ±1mm, Z ±0.35mm, α ±25°, β ±25° | |
| Upgradable | STEM, Cryo Samples, Tomography, EDS Analysis |
| Warranty | Warranty One (1) Year. |
| Optional Accessories | |
| Installation | On-Site Installation & Operational Training Service Pack Optional |
| STEM | PNDetector Annular STEM Detector, Advanced Module ADV-STEM (Including STEM-HAADF and BF) |
| EDS | Bruker XFlash 7T30S |
| Tomography Holder | 1..Sample size: φ3mm. |
| 2. Alpha tilt range: ±70°. | |
| 3. Resolution: ≤0.34nm (in any direction). | |
| 4. Drift rate: <1.5nm/min. | |
| 5. Field of view: ≥1.6mm@70°tilt. | |
| Cryo-Sample Holder | Cryo-Sample holder: |
| 1. Sample Size: φ3mm. | |
| 2. Alpha Tilt Range: ±70°. | |
| 3. Resolution: ≤0.34nm (In Any Direction). | |
| 4. Drift Rate: <1.5nm/min. | |
| 5. Field of View: ≥1.6mm@70°tilt. | |
| Molecular Pumping Station | |
| 1. Ultimate Vacuum Better Than 10e-7 mbar. | |
| 2.Multi-functional: Sample And Rod Storage, In-situ Rod Leak Testing. | |
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